|
Parameter
|
Type
|
Description
|
|---|---|---|
|
Foreign
|
Checkbox [Parts Count also]
|
Indicates whether the device is made in China. If this checkbox is selected, the failure rate of the part is calculated based on Appendix A for the 299C Parts Count or Parts Stress model chosen.
|
|
Two Sided
|
Checkbox [Parts Count also]
|
When selected, the device is two-sided. Data entry fields for the second side become available. The fields for side 2 apply only to side 2. The thermal resistance and minimum temperature rating values for side 2 are assumed to be the same as the values for side 1.
|
|
Quality Level
|
Choice List [Parts Count also]
|
The appropriate quality screening level of the device. Accepted quality levels and values for the Si FET subcategory follow.
• A3 = 0.05
• A4 = 0.1
• A5 = 0.2
• B1 = 0.5
• B2 = 1
• C = 5.00
|
|
Application
|
Choice List [Parts Count also]
|
The application of the device in the circuit. Choices are:
• High Frequency
• Linear
• Switch
|
|
Type
|
Choice List
|
Not required when Foreign is selected.
The type of device. Choices are:
• JFET
• MOSFET
|
|
Construction Type
|
Choice List
|
Not required when Foreign is selected.
The type of construction. Choices are:
• Dual Unmatched
• Dual Matched
• Quadrode
• Single Transistor
|
|
[Power Parameters]
|
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|
For more information, see Power Parameters.
|
|
[Temperature Parameters]
|
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|
For more information, see Comprehensive Temperature Parameters.
|
|
[Derating Parameters]
|
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|
For more information, see Derating Parameters.
|