The Arrhenius model is used in accelerated life testing of electronic components to establish a relationship between a stress, which is typically absolute temperature, and reliability. The equation for the Arrhenius model is:

Where:

L = The life characteristic measure such as characteristic life, mean, or median.

V = The stress level (in absolute units if it is temperature).

C = One of the model parameters to determine, where C > 0.

B = Another model parameter to determine.