Failure Rates and K Factors

Additional Resources > Windchill Risk and Reliability Practitioner’s Guide > Reliability Prediction Methods > Hybrid Microelectronic Devices > Failure Rates and K Factors

For each listed part, record the operational base failure rate of the part. Using the engineering data recorded on the worksheet and any other design or manufacturing considerations (e.g., quality screening policy), determine the K factors appropriate to the intended use of the part.

Calculate the predicted failure rate for each part by inserting the recorded values of base failure rates and K factors in the appropriate failure rate model for either operational or non-operational modes. (See Table A-57 and Table A-58.)

Sum the predicted failure rates of the individual parts to give the predicted failure rate of the item.

Failure rate models, data and K factors are described fully in Appendix A tables as

Table 3-4. Generic Failure Rate Tables
Table	Section Title and Page Number
Table A-2 through Table A-35	Stress Ratio for Electronic and Electro-Mechanical Components
Table A-36 and Table A-37	Connectors
Table A-38 through Table A-47	Microelectronic Devices (Excluding Hybrids)
Table A-48 through Table A-55	Microelectronic Hybrid Devices
Table A-56	Mechanical Devices

The data tables in Appendix A should normally be used as the source of failure rate data. When other sources are used, they should be recorded on the worksheets and approved by the contracting authority.