Distribution | Calculation |
---|---|
Chi-Square | Computes accumulated test time using a demonstration type of reliability, MTBF, or LX. For more information, see Using the Chi-Square Distribution to Compute Accumulated Test Time. |
Non-Parametric Binomial | Computes reliability, confidence level, number of units, or allowable failures. For more information, see Using the Non-Parametric Binomial Distribution to Compute Reliability, Confidence Level, or Other Values. |
Parametric Binomial | Computes test time or test units. For more information, see Using the Parametric Binomial Distribution to Compute Test Time or Units. |