The failure rate data and factors which are peculiar to the hybrid failure rate model given in equation (3.5) are listed in Table A-48 through Table A-55. When calculating the operational failure rates (λC) of particular discrete components or integrated circuits, the methods and data given in General Philosophy and Process of Reliability Prediction, and/or Reliability Modelling, must be used as appropriate. However, the die correction factor, KG, that must be applied to these failure rates is that given in Table A-48.