Test Data Extrapolation

Windchill Risk and Reliability Desktop Help > Windchill Prediction > Part Parameters Required for Predictions > User-Defined Parts > Test Data Extrapolation

If test data is available for the user-defined part, you can use the Test Data Extrapolation method to compute its failure rate. For more information, see Test Data Extrapolation Failure Rate Equation.

1. For Failure Method, select Test Data Extrapolation. The parameters under Test Data Extrapolation become available.

2. Complete these parameters.

View Option Descriptions

Parameter	Type	Description
Number of Test Devices	Real	The number of test devices.
Number of Test Hours	Real	The number of test hours.
Total Device Test Hours	Real	The total number of device test hours. This can be calculated (Number of Test Devices * Number of Test Hours) or entered manually.
Number of Failures	Real	The number of failures.
Burn-in Temperature	Real (Degrees C)	The burn-in temperature of the device.
Temp Rise	Real (Degrees C)	The temperature rise from ambient to the device. This is added to the operating temperature of the subassembly to yield device temperature.
Activation Energy	Real	The activation energy (eV) for the process.
Confidence Level	Real	The confidence level to use the computation.
Use Lower Bound	Checkbox	Indicates whether to use the lower bound to calculate the confidence level.