Case
|
Description
|
---|---|
L1
|
Case L1 is used if test data is available for devices (the lowest component or part level) and there is no device burn-in.
|
L2
|
Case L2 is used if test data is available for units (one level above devices, such as assemblies) andthere is no device or unit burn-in.
|
L3
|
Case L3 is used if test data is available for devices and devices have had burn-in.
|
L4
|
Case L4 is used if test data is available for units and devices or if units have had burn-in.
|