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Field
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Description
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Device Burn-In
The options under this heading are used to calculate the first year multiplier, which is then used to calculate the first year drop out or infant morality rate. The burn-in data that you enter is not used in the steady state failure rate calculation for the part.
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Device burn-in time
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The amount of time spent burning in the part in hours.
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Device burn-in temperature
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The temperature for the burn-in period of the part in degrees C.
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Laboratory Data
The options under this heading are available only when Method II Case L1 or Method II Case L3 is selected.
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Number of failures, lab
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The number of failures in the laboratory test.
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Number of devices, lab
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The number of units in the laboratory test.
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Test time, lab
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The actual time on test in hours. This value is used in the calculation ofeffective time on test.
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Test temperature, lab
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The temperature at which the laboratory test was conducted. This value is usedin the calculation of the acceleration factor and effective time on test.
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Field Data
The options under this heading are available when Method III choices are selected.
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Operating time, field
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The total operating hours of the part. This option is available for any Method III choice.
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Number of failures, field
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The number of part failures observed. This option is available for any Method III choice.
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Tracked temperature, field
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The test temperature of the part. This option is available when Method III(b) is selected.
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Tracked failure rate, field
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The steady state failure rate prediction using Method I Case 3. This option isavailable when Method III(c) is selected.
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