Integrated Circuits
The following tables list the prediction data fields exported for Integrated Circuit subcategories when 299B Parts Stress is selected as the model.
Bubble Memory
Custom
EEPROM
GaAs Digital
The only exported field is:
Failure Rate
The only exported field is:
Failure Rate
Exported fields are:
Technology Type
Quality Level
# of Bits
Units
Pins
# of Gates
Programming Cycles
Package Type
Learning Factor
Rated Voltage
Operating Voltage
Initial Temp Rise
Operating Power
Thermal Resistance
Junction-
Temperature Rise
Junction Temp Override
The only exported field is:
Failure Rate
GaAs MMIC
Linear
Logic, CGA or ASIC
Memory
The only exported field is:
Failure Rate
Exported fields are:
Quality Level
# of Transistors
Pins
Package Type
Learning Factor
Initial Temp Rise
Operating Power
Thermal Resistance
Junction-
Temperature Rise
Junction Temp Override
Exported fields are:
Technology Type
CMOS
Quality Level
# of Gates
Pins
Package Type
Learning Factor
Rated Voltage
Operating Voltage
Initial Temp Rise
Operating Power
Thermal Resistance
Junction-
Temperature Rise
Junction Temp Override
Exported fields are:
Type
Technology Type
Quality Level
# of Bits
Units
Pins
# of Gates
Package Type
Learning Factor
Rated Voltage
Operating Voltage
Initial Temp Rise
Operating Power
Thermal Resistance
Junction-
Temperature Rise
Junction Temp Override
Microprocessor
PAL, PLA
SAW - Surface Acoustic Wave
VHSIC/VLSI CMOS
Exported fields are:
Technology Type
CMOS
Quality Level
Word Size
Pins
Package Type
Learning Factor
Rated Voltage
Operating Voltage
Initial Temp Rise
Operating Power
Thermal Resistance
Junction-
Temperature Rise
Junction Temp Override
Exported fields are:
Technology Type
CMOS
Quality Level
# of Gates
Pins
Package Type
Learning Factor
Rated Voltage
Operating Voltage
Initial Temp Rise
Operating Power
Thermal Resistance
Junction-
Temperature Rise
Junction Temp Override
The only exported field is:
Quality Level
The only exported field is:
Failure Rate