Integrated Circuits

Windchill Risk and Reliability Desktop Help > Appendices > Prediction Data Exports > Telcordia Issue 3 Prediction Data Fields > Integrated Circuits

Integrated Circuits

The following tables list the prediction data fields exported for Integrated Circuit subcategories when Telcordia Issue 3 is selected as the model.

Bubble Memory	Custom	EEPROM	GaAs Digital
Exported fields are: • Failure Rate • Standard Deviation	Exported fields are: • Failure Rate • Standard Deviation	Exported fields are: • Quality Level • Technology Type • # of Bits • Units • Temperature Rise • Temp Override	Exported fields are: • Quality Level • Technology Type • # of Gates • Temperature Rise • Temp Override

GaAs MMIC	Linear	Logic, CGA or ASIC	Memory
Exported fields are: • Quality Level • Technology Type • # of Gates • Units • Temperature Rise • Temp Override	Exported fields are: • Quality Level • # of Transistors • Temperature Rise • Temp Override	Exported fields are: • Quality Level • Technology Type • # of Gates • Units • Temperature Rise • Temp Override	Exported fields are: • Quality Level • Type • Technology Type • # of Bits • Units • Temperature Rise • Temp Override

Microprocessor	PAL, PLA	SAW - Surface Acoustic Wave	VHSIC/VLSI CMOS
Exported fields are: • Quality Level • Technology Type • # of Gates • Bus Width (in bits) • Temperature Rise • Temp Override	Exported fields are: • Quality Level • Technology Type • # of Gates • # of Transistors • Temperature Rise • Temp Override	Exported fields are: • Failure Rate • Standard Deviation	Exported fields are: • Quality Level • Technology Type • # of Gates • Temperature Rise • Temp Override