Integrated Circuits
The following tables list the prediction data fields exported for Integrated Circuit subcategories when FIDES 2009 Parts Count is selected as the model.
ASIC
CPLD
Digital Circuit
DRAM
Exported fields are:
Application Factor
Ruggedized Factor
Type
Package Type
Pins
Exported fields are:
Application Factor
Ruggedized Factor
Package Type
Pins
Exported fields are:
Application Factor
Ruggedized Factor
Package Type
Pins
Exported fields are:
Application Factor
Ruggedized Factor
Package Type
Pins
DSP
EEPROM
EPROM
FLASH EEPROM
Exported fields are:
Application Factor
Ruggedized Factor
Package Type
Pins
Exported fields are:
Application Factor
Ruggedized Factor
Package Type
Pins
Exported fields are:
Application Factor
Ruggedized Factor
Package Type
Pins
Exported fields are:
Application Factor
Ruggedized Factor
Package Type
Pins
FPGA
FPGA (Anitfuse)
Linear Circuit
LV Circuit
Exported fields are:
Application Factor
Ruggedized Factor
Package Type
Pins
Exported fields are:
Application Factor
Ruggedized Factor
Package Type
Pins
Exported fields are:
Application Factor
Ruggedized Factor
Package Type
Pins
The only exported field is:
Failure Rate
Microcontroller
Microprocessor
Mixed Circuit
Exported fields are:
Application Factor
Ruggedized Factor
Package Type
Pins
Exported fields are:
Application Factor
Ruggedized Factor
Package Type
Pins
Exported fields are:
Application Factor
Ruggedized Factor
Package Type
Pins
Mixed LV Circuit
PAL (BiPolar)
SRAM
Exported fields are:
Application Factor
Ruggedized Factor
Package Type
Pins
Exported fields are:
Application Factor
Ruggedized Factor
Package Type
Pins
Exported fields are:
Application Factor
Ruggedized Factor
Package Type
Pins