This section describes the failure rate models to be used for predicting the failure rates of microelectronic devices under stated environmental and operating conditions. It also provides the base failure rates for various types of device and environmental and other factors for use in the models.

During the early stages of a project, the failure rate models may not be applicable due to lack of detailed information. Generic failure rate data for certain devices is therefore provided for use in such cases.

The data contained here also has application when predicting the failure rates of hybrid microelectronic devices. This particular application is discussed in Hybrid Microelectronic Devices.